We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.


New Software for Malvern’s Morphologi G3 Puts Particles in a Different Light!

Want a FREE PDF version of This Product News?

Complete the form below and we will email you a PDF version of "New Software for Malvern’s Morphologi G3 Puts Particles in a Different Light!"

First Name*
Last Name*
Email Address*
Company Type*
Job Function*
Would you like to receive further email communication from Technology Networks?

Technology Networks Ltd. needs the contact information you provide to us to contact you about our products and services. You may unsubscribe from these communications at any time. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our Privacy Policy

Malvern Instruments has released a new version of software for the company’s Morphologi G3 particle characterization system.

This fully automated image analysis-based system delivers particle size and shape information for wet and dry samples, and for the analysis of foreign particulate matter collected on filters.

Among the new applications in the version 7.40 software are facilities for user-defined light settings and automated dark-field measurements, further extending the range of applications for which the Morphologi G3 can be used.

A new reanalyze function enables the application of filters, classes and the rebinning of data to multiple records, for improved productivity and workflow.

With the new software, Morphologi G3 users can now more closely define their own light settings in the standard operating procedures (SOP), allowing for darkfield and polarizer measurements.

The Version 7.40 software also introduces a polygonal selection tool for tighter definition of size and shape classes, and a circular area selection tool for more accurate analysis of particulates on filters.

The Morphologi G3 automated particle characterization system provides statistically significant, high-quality image data for thousands of particles in one measurement.