Quartz Imaging Introduces Next Generation FA-LIMS System
Product News Nov 21, 2012
Quartz Imaging Corporation showcased its’ newest release of its’ FA-LIMS system (Failure Analysis Laboratory Information System) at the International Symposium for Testing & Failure Analysis (ISTFA 2012), held in Phoenix, AZ on November 13th and 14th. The first generation of the Quartz Basic LIMS and FA-LIMS has been successfully deployed in many companies around the world including multi-national semi-conductor organizations.
Quartz FA-LIMS (Failure Analysis Laboratory Information System) is designed specifically for Semiconductor Failure Analysis Labs. Users of Quartz FA-LIMS have reported significant time savings and improved effectiveness of their laboratory workflow. This next generation of FA-LIMS has been improved in a number of key areas.
The new FA-LIMS system utilizes new underlying technology to operate with Windows Server 2012 and supports the latest browsers including Internet Explorer, Chrome, Firefox and Safari. This web-based system has an improved security model making it easier to administer system security. The job management process has been further streamlined from previous versions while providing more advanced management reports of key performance indicators. Recognizing how much time our customers have saved using the search functions we have also improved search capabilities and added the use of keywords that can be easily added to job and image data. We have also expanded the functionality for creating roles and the different system access that is associated with each role.
The “Image Smart” FA-LIMS is a web based application that features: Detailed job requests from authorized internal and external customers; Job approval and priority schemes; Assignment of tasks based on the approved request; Preliminary and approved reports that are very quick and easy to generate; and Lab performance reports for management.