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Brazil’s INMETRO Selects FEI for new Nano-Materials Center
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FEI Company has announced that Brazil’s National Institute of Metrology, Standardization and Industrial Quality-INMETRO-has selected FEI to supply a suite of tools that enable nanoscale materials research.
The selected systems include FEI’s ultra-high resolution Titan™ S/TEM, a Tecnai™ TEM and a Nova NanoLab 600 DualBeam™ tool.
These systems will be used by the institute and other Brazilian institutions at INMETRO’s new nano-materials center in Rio de Janeiro.
"Each of these new systems will provide us with the necessary ability to measure and characterize nano-materials accurately and with more data than ever before," said Humberto Brandi, Director of Scientific and Industrial Metrology of INMETRO.
"In combination they will be an invaluable set of tools to reveal 3D data down to the sub- Ångstrom level."
"The ultra-high resolution, reliability and ease of use of FEI tools are enabling the world’s leading institutes and companies to advance their work at the nanoscale," said Rob Fastenau, senior vice president and general manager of FEI’s NanoResearch & Industry market division.
"We are very pleased to be working with INMETRO and look forward to a successful relationship with this important center."
