Electron Microscopy – Products

Workflow provides a coherent and correlated view of image data sets over a range of scales, from macro-scale features of the drill core to sub-micron-scale porosity features.

An innovative configuration of the proven AURIGA® CrossBeam (FIB-SEM) workstation combines a pulsed micro-focus laser for fast ablation of material with proven FIB-SEM technology.

Lift-Out Shuttle for electron microscopists.

XEI's Evactron De-Contaminators were well accepted, providing users with an efficient cleaning tool at a good price.

The Leica SR GSD microscope system visualizes small subcellular structures far below the diffraction limit.

Sensitivity, speed, resolution and 3D analytical capabilities will enable breakthroughs in many key customer application areas.

SIMPore makes the world’s thinnest and most permeable nanoporous membranes which enable the saving of time, money and resources.

EDS for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes.

JEOL InTouchScope™ SEM has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products.