Electron Microscopy – Products

Product News
FEI Introduces Nova NanoSEM 50 Series
New family of electron microscopes combines ultra-high resolution and analytical performance for the widest range of materials.

Product News
Thermo Fisher Scientific Demonstrates Advances in Materials Analysis Instrumentation at Microscopy and Microanalysis 2010
The company will unveil the Thermo Scientific QuasOr EBSD for its all-in-one microanalysis solution, NORAN System 7, during the show.

Product News
Thermo Combines EDS and WDS with new EBSD Option for NORAN System 7 Microanalysis System
The system is said to comprise the first combination of EBSD with EDS and WDS capabilities in a single software interface.

Product News
Thermo Fisher Scientific Combines EDS and WDS with new EBSD Option for NORAN System 7 Microanalysis System
New Thermo Scientific QuasOr is fully integrated into the NORAN System 7 microanalysis platform.

Product News
FEI Announces Flagship Helios NanoLab x50 DualBeam Series
Helios outperforms competition for failure analysis, 3D nanoscale characterization and prototyping, and other techniques.

Product News
AnaSpec Introduces Biotin Labeled b-Amyloid GO™ Peptides
The new b-amyloid peptides are labeled with biotin as well as N-terminal biotin labeled b-amyloid peptides with a fluorescein label on the C-terminus.

Product News
FEI Introduces the Fibermetric System for Automated Measurement and Analysis of Micro- and Nano-fibers
The Fibermetric system is developed to deliver statistically valid data in minutes to improve fiber and filter material development and manufacturing.

Product News
NanoSight Launches LM10-HS Nanoparticle Characterization System
NanoSight adds new super-sensitive system to its range of instruments for imaging and sizing nanoparticles in liquid suspension.

Product News
Bruker AXS Microanalysis Announces European Launch of Ultra-fast EBSD System
Next-Generation 123 eV resolution XFlash® silicon drift detectors and advanced particle analysis software launched at EMC 2008.

Product News
NanoSight Speeds Leeds University’s Characterization of Wear Debris in Orthopaedic Implants
NanoSight Limited announced that the University of Leeds is committed to the use of their Nanoparticle Tracking Analysis system for the study of wear debris generated in orthopaedic implants.
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