Electron Microscopy – Products

The National Institute of Standards and Technology (NIST) has used the Zetasizer Nano particle characterization system from Malvern Instruments as part of the qualification and assessment process for its new gold nanoparticle reference materials.

The Company has introduced 123 eV resolution XFlash® silicon drift detectors and new particle analysis software.

The new FEI® Connectivity Solutions are designed to reduce a lab’s “wafers-to-atoms” time from days to hours.

According to Company, its Magellan SEM is first to enable rapid 3D surface imaging at sub-nanometer resolution.

According to FEI, the Titan ETEM allows researchers to see chemistry and nanoscale catalysis at the atomic level.

Sidec Protein Tomography™ technology can improve the analysis of therapeutic antibodies and drug targets in biological systems.

The InSight 3DAFM was designed specifically to address in-line CD, depth and CMP metrology applications.

The demonstration and training facility includes sample preparation areas and laboratory space equipped with the latest systems from each of the Bruker companies.

The Mark IV features a touchscreen user interface operated under a Linux operating system and robotics that ensures reproducible freezing of samples.

LCN can now offer scientists the opportunity to view and analyse material at a resolution smaller than half a nanometre.