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Electron Microscopy – Products

Product News

New nanoparticle reference materials support development

The National Institute of Standards and Technology (NIST) has used the Zetasizer Nano particle characterization system from Malvern Instruments as part of the qualification and assessment process for its new gold nanoparticle reference materials.
Product News

Bruker AXS Microanalysis Introduces Ultra-fast EBSD System

The Company has introduced 123 eV resolution XFlash® silicon drift detectors and new particle analysis software.
Product News

FEI Connectivity Solutions Accelerate TEM Imaging for Semiconductor Manufacturing

The new FEI® Connectivity Solutions are designed to reduce a lab’s “wafers-to-atoms” time from days to hours.
Product News

FEI Introduces new Category of Extreme High Resolution Scanning Electron Microscopy

According to Company, its Magellan SEM is first to enable rapid 3D surface imaging at sub-nanometer resolution.
Product News

FEI Announces Titan ETEM for Energy, Environmental and Chemical Research

According to FEI, the Titan ETEM allows researchers to see chemistry and nanoscale catalysis at the atomic level.
Product News

Enhanced Protein Tomography™ Method for Rapid Epitope Determination

Sidec Protein Tomography™ technology can improve the analysis of therapeutic antibodies and drug targets in biological systems.
Product News

Veeco Introduces new InSight 3D Atomic Force Microscope

The InSight 3DAFM was designed specifically to address in-line CD, depth and CMP metrology applications.
Product News

Bruker Companies Announce the Opening of a Modern Chinese Applications, Demonstration and Customer Training Center in Beijing

The demonstration and training facility includes sample preparation areas and laboratory space equipped with the latest systems from each of the Bruker companies.
Product News

FEI Introduces Vitrobot Mark IV

The Mark IV features a touchscreen user interface operated under a Linux operating system and robotics that ensures reproducible freezing of samples.
Product News

Imperial College London Unveils UK’s Titan™ S/TEM

LCN can now offer scientists the opportunity to view and analyse material at a resolution smaller than half a nanometre.
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