Electron Microscopy – Products
Product News
FEI Launches Research Dualbeam
Helios NanoLab™ DualBeam will enable nanoscale imaging, analysis, fabrication and sample prep applications.
Product News
Leica Microsystems Presents System Solutions for Research and Industry
Leica is presenting the TCS SP5 Broadband Confocal System for high-end applications.
Product News
FEI’s Automated 3D Crystallography Featured at Pittcon
FEI’s EBS3 solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials.
Product News
FEI Introduces Cryo Sample Prep Tool for Organic Samples
The Vitrobot™ ensures automated sample vitrification for real-time 2D and 3D cryo observations of macromolecular structures.
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